With this system, the use of pen-plotters for diagram and spectrogram can be avoided. It is also an easy way to upgrade a system which does not have a spectrogram or a pen plotter to plot diagrams. All the output results can be printed via a general purpose dot-matrix printer, thus reducing costly consumables. An added feature of this system is the ability to store the actual tests for later retrieval and analysis.
| Standard Sensitivities | |
| Thin | -30% -40% -50% -60% |
| Thick | +35% +50% +70% +100% |
| Neps | +140% +200% +280% +400% |
| Detailed Sensitivities | |
| Thin | -30% -33% -35% -38% -40% -43% -45% -48% -50% -53% -55% -58% -60% |
| Thick | +35% +38% +40% +43% +45% +48% +50% +53% +55% +58% +60% +63% +65% +68% +70% +73% +75% +78% +80% +83% +85% +88% +90% +93% +95% +98% +100% |
| Neps | +140% +150% +160% +170% +180% +190% +200% +210% +220% +230% +240% +250% +260% +270% +280% +290% +300% +310% +320% +330% +340% +350% +360% +370% +380% +390% +400% |
| Display Imperfections per KM option available. | |
| Eventex provides detailed sensitivites also. It amounts to 13 sensitivities for thin places and 27 each for thick places and neps. Sometimes, at a particular sensitivity, say +50% for thick places the amount of imperfections may be very less. But, in the yarn, the amount of imperfections may be manifold when the sensitivity is reduced by just 2%. The Detailed Sensitivity levels are provided in order to detect such problems, before the customer can find them. | |
| Mass Variation Ranges | 5% 10% 20% |
| Wavelengths | 2cm to 432m |
| Wavelength Count | 73 |
| Eventex displays the strength of the variation of a particular wavelength as a percentage of the mean of the yarn. For e.g., if the wavelength at 10.2m reads 2.2%, it means that at a wavelength of 10.2m, the variation is 2.2% of the yarn mean. | |
| The wavelengths of each and every channel are labelled, so that the user can determine the wavelength easily, just by looking at the spectrogram. This is an advantage over the spectrogram provided by other evenness testers, where the user has to determine the wavelength by interpolation from the nearest labelled wavelength. | |
| Cut Lengths |
2mm 3mm 6mm 10cm 20cm 30cm 60 cm 1m 2m 3m 6m 10m 20m 30m 60m 100m 200m 300m |
|
| Parameters | U% and CV% | |
| Ranges | 10% 20% 50% | |
| Eventex provides the U% and CV% for a wider range of cut-lengths than the most modern evenness testers. | ||
| Mass Ranges |
+/-12.5% +/-25% +/-50% +/-100% +200%/-100% +400%/-100% |
| Scale |
1mm, 2mm, 5mm 1cm, 2cm, 5cm 10cm, 20cm, 50cm 1m, 2m, 5m, 10m |
| Normal mode and Cut-Length mode options | |
| Eventex provides additional ranges of +200%/-100% and +400%/-100%. These ranges enable imperfections beyond the +100% limit to be visualized in their entirety, which is not possible with the +/-100% range. | |
| Eventex provides Diagram Scales of even 1mm, which enables the yarn to be studied in its actual size for analysis purposes. It also provides Diagram Scales which enable the entire test length to be seen in one frame, even for tests at 400m/min and 20 min. | |
| Mass Ranges |
+/-25% +/-50% +/-100% +200/-100% +400/-100% |
| Frequency Ranges | 5% 10% 20% 50% |
| Summary Sample Readings |
U%, U% Index of Irregularity CV% CV% Index of Irregularity Average Value Factor AF% Relative Count to Mean RC% Thin Thick Neps and Total Imperfections Thin Thick Neps and Total Imperfections per KM |
| Summary Results |
Mean Median Minimum Maximum Standard Deviation Coefficient of Variation Q95 confidence limits |
300,000 samples @ 100m/min 1min
